RF Test Probe SMA to Needle Tip Probe for Spectrum Analyzer Signal Tracing Circuit Testing LNA Ham Radio Amplifier Oscilloscope

SMA to Single‑Pin / Dual‑Pin High‑Frequency Test Probe – RF Phone Test Head, SMA‑KF Crown Tip FOR Spectrum Analyzer & RF Signal Debugging Repair Ham Radio Amplifier

Please refer to the advertisement test video before making the purchase.

Product Description:

This high‑frequency test probe is a precision connector designed for rapid, non‑destructive testing of electronic circuits. Its core function is to

establish a repeatable temporary electrical connection for signal acquisition and parameter measurement without damaging the device under

test (DUT) or interfering with normal circuit operation. It eliminates the need for additional flying wires or dedicated test connectors,

making it ideal for probing intermediate test points on PCBs. Available in single‑pin or dual‑pin configurations, with crown tip . SMA‑KF interface (female, with flange). Suitable for RF testing, mobile phone production lines, R&D labs, and field repairs.

Specifications:

Impedance: 50Ω

Mechanical Life: ≥8000 cycles

Contact Resistance: 100mΩ

Insulation Resistance: 1000MΩ

Materials:

Pin: Beryllium copper, nickel‑plated

Insulator: PTFE (Teflon)

Housing: Brass, nickel‑plated